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Nanometer-Scale Defect Detection Using Polarized Light eBook
language: english
Publisher:
WILEY, August of 2016 ‧
see product details
184,11€
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
IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781119329688 |
| Publisher: | WILEY |
| Release Date: | August of 2016 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | |
| Categories: |
eBooks in English
>
Engineering
>
General Engineering
|
| EAN: | 9781119329688 |
| Acessibilidade: | Ver características de acessibilidade indicadas pelo editor |
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