Pierre-Richard Dahoo
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Bibliography
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Applications And Metrology At Nanometer-Scale 2ISTE LTD AND JOHN WILEY & SONS INC05-2021177,61€
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Applications And Metrology At Nanometer Scale 1ISTE LTD AND JOHN WILEY & SONS INC02-2021177,61€
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imagem não disponívelDéfauts À L'Échelle Nanométrique En Lumière Polarisée10%Défauts À L'Échelle Nanométrique En Lumière PolariséeISTE07-201677,87€ 10% CARDfree shipping