Philippe Pougnet
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Applications Et Metrologie A L'Echelle Nanometrique 1eBookISTE Editions10-20210,00€
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Applications Et Metrologie A L'Echelle Nanometrique 2eBookISTE Editions10-20210,00€
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Applications And Metrology At Nanometer-Scale 2eBookWILEY04-20210,00€
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Applications And Metrology At Nanometer-Scale 2eBookWILEY03-20210,00€
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Applications And Metrology At Nanometer Scale 1eBookWILEY01-20210,00€
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Applications And Metrology At Nanometer Scale 1eBookWILEY01-20210,00€
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Les Systemes Mecatroniques Embarques 2eBookISTE Editions02-20200,00€
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Les Systemes Mecatroniques Embarques 1eBookISTE Editions02-20200,00€
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Nanometer-Scale Defect Detection Using Polarized LighteBookWILEY08-20160,00€
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Nanometer-Scale Defect Detection Using Polarized LighteBookWILEY08-20160,00€
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Defauts A L'Echelle Nanometrique En Lumiere PolariseeeBookISTE Editions07-20160,00€