Applications And Metrology At Nanometer-Scale 2

Measurement Systems, Quantum Engineering And Rbdo Method

by Abdelkhalak El Hami, Pierre-Richard Dahoo e Philippe Pougnet
language: english
Publisher: ISTE LTD AND JOHN WILEY & SONS INC, May of 2021 ‧
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Applications And Metrology At Nanometer-Scale 2

Measurement Systems, Quantum Engineering And Rbdo Method

by Abdelkhalak El Hami, Pierre-Richard Dahoo e Philippe Pougnet

Property Description
ISBN: 9781786306876
Publisher: ISTE LTD AND JOHN WILEY & SONS INC
Release Date: May of 2021
Language: English
Dimensions: 163 x 247 x 22 mm
Cover: Hardcover
Pages: 288
Format: Book
Collection: Wiley-Iste Series
Categories: Books in English > Engineering > Mechanical Engineering
Books in English > Others
EAN: 9781786306876