Parameter-Centric Scaled Fet Devices
Physics Based Perspectives And Attributes
Book
eBook
language: english
Publisher:
Springer International Publishing AG, March of 2025 ‧
see product details
42,57€
10% OFF
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
free shipping
Sell your book
SYNOPSIS
Parameters that determine the performance of silicon-based Field Effect Transistors (FET) devices in the presence of degenerate doping, often are not modeled properly and so require precise analysis to improve modeling accuracy.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9783031842856 |
| Publisher: | Springer International Publishing AG |
| Release Date: | March of 2025 |
| Language: | English |
| Dimensions: | 168 x 240 x 20 mm |
| Cover: | Hardcover |
| Pages: | 129 |
| Format: | Book |
| Collection: | Synthesis Lectures On Emerging Engineering Technologies |
| Categories: |
Books in English
>
Science
>
Physical
|
| EAN: | 9783031842856 |
BOOKS FROM THE SAME COLLECTION
-
From 2d To 3d Photonic Integrated Circuits10%Springer International Publishing AG54,74€
60,82€free shipping -
imagem não disponívelVisual Analytics For Process MonitoringVisual Analytics For Process MonitoringPre-order10%Springer Nature Switzerland AG42,57€
47,30€free shipping
-
Low Substrate Temperature Modeling Outlook Of Scaled N-Mosfet10%Springer International Publishing AG37,84€ 10% CARDfree shipping
-
New Prospects Of Integrating Low Substrate Temperatures With Scaling-Sustained Device Architectural Innovation10%Springer International Publishing AG33,79€ 10% CARDfree shipping