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Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Matthias Thiele, Susann Rothe e Jens Lienig
language: english
Publisher: Springer International Publishing AG, February of 2025 ‧
148,70€
133,83€
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Matthias Thiele, Susann Rothe e Jens Lienig

Property Description
ISBN: 9783031800221
Publisher: Springer International Publishing AG
Release Date: February of 2025
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 167
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9783031800221