Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Jens Lienig e Matthias Thiele
Publisher: Springer Nature Switzerland AG, December of 2018 ‧
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Jens Lienig e Matthias Thiele

Property Description
ISBN: 9783030088118
Publisher: Springer Nature Switzerland AG
Release Date: December of 2018
Dimensions: 155 x 235 x 20 mm
Cover: Softcover
Pages: 159
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9783030088118