Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Jens Lienig e Matthias Thiele
language: english
Publisher: Springer International Publishing AG, March of 2018 ‧
OUT OF STOCK OR NOT AVAILABLE
Sell ​​your book
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

Fundamentals Of Electromigration-Aware Integrated Circuit Design

by Jens Lienig e Matthias Thiele

Property Description
ISBN: 9783319735573
Publisher: Springer International Publishing AG
Release Date: March of 2018
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 159
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
Books in English > Others
EAN: 9783319735573