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Metal Impurities In Silicon- And Germanium-Based Technologies eBook

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys
language: english
Publisher: Springer International Publishing, August of 2018 ‧
198,09€
158,47€
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material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

Metal Impurities In Silicon- And Germanium-Based Technologies

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys

Property Description
ISBN: 9783319939254
Publisher: Springer International Publishing
Release Date: August of 2018
Language: English
Format: eBook
File Format and Compatibility:
Collection: Springer Series In Materials Science
Categories: eBooks in English > Engineering > General Engineering
EAN: 9783319939254
Acessibilidade: Ver características de acessibilidade indicadas pelo editor

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