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Metal Impurities In Silicon- And Germanium-Based Technologies

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys
language: english
Publisher: Springer International Publishing AG, August of 2018 ‧
202,77€
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material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

Metal Impurities In Silicon- And Germanium-Based Technologies

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys

Property Description
ISBN: 9783319939247
Publisher: Springer International Publishing AG
Release Date: August of 2018
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 438
Format: Book
Collection: Springer Series In Materials Science
Categories: Books in English > Engineering > General Engineering
EAN: 9783319939247

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