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Metal Impurities In Silicon- And Germanium-Based Technologies

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys
language: english
Publisher: Springer Nature Switzerland AG, January of 2019 ‧
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material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

Metal Impurities In Silicon- And Germanium-Based Technologies

Origin, Characterization, Control, And Device Impact

by Eddy Simoen e Cor Claeys

Property Description
ISBN: 9783030067472
Publisher: Springer Nature Switzerland AG
Release Date: January of 2019
Language: English
Dimensions: 156 x 234 x 20 mm
Cover: Softcover
Pages: 438
Format: Book
Collection: Springer Series In Materials Science
Categories: Books in English > Engineering > General Engineering
Books in English > Engineering > Mechanical Engineering
EAN: 9783030067472

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