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Influence Of Temperature On Microelectronics And System Reliability eBook

A Physics Of Failure Approach

by Michael Pecht, Edward B. Hakim e Pradeep Lall
language: english
Publisher: CRC PRESS, July of 2020 ‧
55,64€
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This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.

Influence Of Temperature On Microelectronics And System Reliability

A Physics Of Failure Approach

by Michael Pecht, Edward B. Hakim e Pradeep Lall

Property Description
ISBN: 9780429611117
Publisher: CRC PRESS
Release Date: July of 2020
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Art > Design and Illustration
eBooks in English > Engineering > Hydraulic Engineering
EAN: 9780429611117