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Influence Of Temperature On Microelectronics And System Reliability

A Physics Of Failure Approach

by Edward B. Hakim, Michael (University Of Maryland, College Park, Usa) Pecht e Pradeep (Auburn University, Alabama, Usa) Lall
language: english
Publisher: TAYLOR & FRANCIS LTD, June of 2019 ‧
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This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.

Influence Of Temperature On Microelectronics And System Reliability

A Physics Of Failure Approach

by Edward B. Hakim, Michael (University Of Maryland, College Park, Usa) Pecht e Pradeep (Auburn University, Alabama, Usa) Lall

Property Description
ISBN: 9780367400972
Publisher: TAYLOR & FRANCIS LTD
Release Date: June of 2019
Language: English
Dimensions: 178 x 254 x 20 mm
Cover: Softcover
Pages: 336
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9780367400972