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Influence Of Temperature On Microelectronics And System Reliability

A Physics Of Failure Approach

by Edward B. Hakim, Michael (University Of Maryland, College Park, Usa) Pecht e Pradeep (Auburn University, Alabama, Usa) Lall
language: english
Publisher: TAYLOR & FRANCIS INC, April of 1997 ‧
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This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.

Influence Of Temperature On Microelectronics And System Reliability

A Physics Of Failure Approach

by Edward B. Hakim, Michael (University Of Maryland, College Park, Usa) Pecht e Pradeep (Auburn University, Alabama, Usa) Lall

Property Description
ISBN: 9780849394508
Publisher: TAYLOR & FRANCIS INC
Release Date: April of 1997
Language: English
Dimensions: 178 x 254 x 21 mm
Cover: Hardcover
Pages: 328
Format: Book
Categories: Books in English > Engineering > Mechanical Engineering
EAN: 9780849394508