Influence Of Temperature On Microelectronics And System Reliability
A Physics Of Failure Approach
language: english
Publisher:
TAYLOR & FRANCIS INC, April of 1997 ‧
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SYNOPSIS
This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780849394508 |
| Publisher: | TAYLOR & FRANCIS INC |
| Release Date: | April of 1997 |
| Language: | English |
| Dimensions: | 178 x 254 x 21 mm |
| Cover: | Hardcover |
| Pages: | 328 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Mechanical Engineering
|
| EAN: | 9780849394508 |