adicionar à lista de desejos
Guidebook For Managing Silicon Chip Reliability
language: english
Publisher:
TAYLOR & FRANCIS INC, December of 1998 ‧
see product details
141,95€
30% OFF
S3pCc2JIRjBZM05WY2pGQ1FUUlJialU0WVV4T01GRnpkVm8zU1VwbVdWY3ZRVWxyV1UxNFRrTllhMlI0VDFCTE5YTXJWRzVJTjFGRlprVlZVVGRwTUVOcGVreDNNeXNyWjAxVWIxWmlURWxzT0ZSR1JUaFNTSGhaUVdadGVuVlllbkZvTmpBclVXbG9WR0ZMY0Vwb2VYSk9NV2t5T0V0VGMzSjBSblJhZG5Wc1RrUXdNalZ0Vlc5SGFHSXlNMlZETWt0TmNYWmtWMU5IV1ZjeldEbG1UV2RwUnpOQ2JVbzJWWEpwYm10NmN6ZEhjREoxYzJoQ2NXaE9WVWRXWTNoM1lpOHhOV3hQVUhaWmMweFpaRGRtTTNwdU1YWTRiVTV2VG1Rd1RGZERTRWRQVlZkMWMxTlBZM2c1V0hNNVRXVlVkMlJHVGxWdk1VUTRja3BMWjJWVFdqRXZVRmRLWmtkS2VtaGxXV3BwVDFwTlNHTTNRakFyWVdwdFppOVBRMFZqU2xWRFZIWjVUV05KTlRKSWQzbHFZWE5rWWxaR1RDODFWR3hWZUZob2RUSmxjM3BZVjBrek1GUjFhVVZ0VjNsVU4xTnVVa2RRYkdoUVFtRnZlRVlyVG5BdmJrSlFVSEpTUWs1dmRtZG9lblJwVFVSR2JIWnRhbXRyV0VscVRVWnVNMlJ2ZDBGc2FpdDJaVmRHVFdoSFlVRkNUMGRMZWxBeVRrbFdialpPWnpVdmFUaFZiM0ZxVlhwME9GcGlVa05YYmxWTFRVMXdSbVpKYUd0WGRFMU9WMm94U214c1JEUkNRbUl6YWxGTGMzZzBlRWhOUmtkSVJWQmlVa3RzVXpGS2NrRmhiVmhFTWxsYVNqZzRObVUwWkc5elpUZFhWMFJFU3pSVmRFOTViMk5CWW05SE1XVXpWM05JZDBKbWVrSmhhM2haUldsNU5XVXhhMHd2UTBNMWNsbGtlRFpzVlZGNFRtNXVkbEoyUkRZNU5XVnlSVGxYY2xOdllsTTVhMFpYY25jNFpGbGFMMWxNTWpOWU5YcGpibUZDUTJ4VWNsUjBiSEJVSzJWNkt6WjFNRUpJZGxBMldpdFdUVWxLVnpsT2RXUkdTbXQ1WVZsM2VreEtlVkJFUWc9PTpWN2ViZ3lRTCtvdklLdDNsdHhYUU9BPT0=
free shipping
Sell your book
SYNOPSIS
Examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This book provides a framework for how to model the mechanism, test for defects, and avoid and manage damage.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780849396243 |
| Publisher: | TAYLOR & FRANCIS INC |
| Release Date: | December of 1998 |
| Language: | English |
| Dimensions: | 156 x 235 x 18 mm |
| Cover: | Hardcover |
| Pages: | 224 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780849396243 |