Spacer Engineered Finfet Architectures
High-Performance Digital Circuit Applications
idioma: inglês
Editor:
TAYLOR & FRANCIS LTD, junho de 2020 ‧
ver detalhes do produto
74,34€
10% DESCONTO
CARTÃO
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
portes grátis
Venda o seu livro
SINOPSE
This book focusses on the spacer engineering aspects of novel MOS-based deviceâ€"circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780367573553 |
| Editor: | TAYLOR & FRANCIS LTD |
| Data de Lançamento: | junho de 2020 |
| Idioma: | Inglês |
| Dimensões: | 156 x 234 x 20 mm |
| Encadernação: | Capa mole |
| Páginas: | 138 |
| Tipo de produto: | Livro |
| Classificação Temática: |
Livros em Inglês
>
Engenharia
>
Engenharia Geral
|
| EAN: | 9780367573553 |