Spacer Engineered Finfet Architectures
High-Performance Digital Circuit Applications
idioma: inglês
Editor:
TAYLOR & FRANCIS INC, junho de 2017 ‧
ver detalhes do produto
232,51€
10% DESCONTO
CARTÃO
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
portes grátis
Venda o seu livro
SINOPSE
This book focusses on the spacer engineering aspects of novel MOS-based deviceâ€"circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781498783590 |
| Editor: | TAYLOR & FRANCIS INC |
| Data de Lançamento: | junho de 2017 |
| Idioma: | Inglês |
| Dimensões: | 156 x 235 x 20 mm |
| Encadernação: | Capa dura |
| Páginas: | 154 |
| Tipo de produto: | Livro |
| Classificação Temática: |
Livros em Inglês
>
Engenharia
>
Engenharia Geral
Livros em Inglês > Outros |
| EAN: | 9781498783590 |