Scanning Electron Microscopy And X-Ray Microanalysis
Third Edition
idioma: inglês
Editor:
Springer Science+Business Media, Janeiro de 2003 ‧
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94,63€
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SINOPSE
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780306472923 |
| Editor: | Springer Science+Business Media |
| Data de Lançamento: | Janeiro de 2003 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 689 |
| Tipo de produto: | Livro |
| Classificação Temática: |
Livros em Inglês
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Ciências Sociais e Humanas
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História e Metodologia Científica
Livros em Inglês > Outros |
| EAN: | 9780306472923 |