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Handbook Of Sample Preparation For Scanning Electron Microscopy And X-Ray Microanalysis
idioma: inglês
Editor:
SPRINGER-VERLAG NEW YORK INC., março de 2009 ‧
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124,45€
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IMEDIATO
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SINOPSE
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780387857305 |
| Editor: | SPRINGER-VERLAG NEW YORK INC. |
| Data de Lançamento: | março de 2009 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 332 |
| Tipo de produto: | Livro |
| Classificação Temática: |
Livros em Inglês
>
Ciências Sociais e Humanas
>
História e Metodologia Científica
|
| EAN: | 9780387857305 |
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