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Cmos Plasma And Process Damage

by Kirk Prall
Book eBook
language: english
Publisher: Springer International Publishing AG, May of 2025 ‧
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Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.

Cmos Plasma And Process Damage

by Kirk Prall

Property Description
ISBN: 9783031890284
Publisher: Springer International Publishing AG
Release Date: May of 2025
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 466
Format: Book
Categories: Books in English > Science > Physical
EAN: 9783031890284