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Cmos Plasma And Process Damage eBook

by Kirk Prall
Book eBook
language: english
Publisher: Springer Nature Switzerland, May of 2025 ‧
145,09€
130,58€
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Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.

Cmos Plasma And Process Damage

by Kirk Prall

Property Description
ISBN: 9783031890291
Publisher: Springer Nature Switzerland
Release Date: May of 2025
Language: English
Format: eBook
Collection: Engineering
Categories: eBooks in English > Science > Physical
EAN: 9783031890291