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Vlsi Test Principles And Architectures eBook

Design For Testability

by Laung-Terng Wang, Xiaoqing Wen e Cheng-Wen Wu
language: english
Publisher: ELSEVIER SCIENCE, August of 2006 ‧
70,21€
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Ebook for ADE
A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.

Vlsi Test Principles And Architectures

Design For Testability

by Laung-Terng Wang, Xiaoqing Wen e Cheng-Wen Wu

Property Description
ISBN: 9780080474793
Publisher: ELSEVIER SCIENCE
Release Date: August of 2006
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Systems On Silicon
Categories: eBooks in English > Art > Design and Illustration
EAN: 9780080474793