System-On-Chip Test Architectures

Nanometer Design For Testability

by Laung-Terng Wang, Nur Touba e Charles E. Stroud
language: english
Publisher: ELSEVIER SCIENCE & TECHNOLOGY, January of 2008 ‧
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A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students.

System-On-Chip Test Architectures

Nanometer Design For Testability

by Laung-Terng Wang, Nur Touba e Charles E. Stroud

Property Description
ISBN: 9780123739735
Publisher: ELSEVIER SCIENCE & TECHNOLOGY
Release Date: January of 2008
Language: English
Cover: Hardcover
Pages: 896
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9780123739735