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System-On-Chip Test Architectures
Nanometer Design For Testability
language: english
Publisher:
ELSEVIER SCIENCE & TECHNOLOGY, January of 2008 ‧
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SYNOPSIS
A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780123739735 |
| Publisher: | ELSEVIER SCIENCE & TECHNOLOGY |
| Release Date: | January of 2008 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 896 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780123739735 |