Vlsi Test Principles And Architectures

Design For Testability

by Laung-Terng Wang, Xiaoqing Wen e Cheng-Wen Wu
language: english
Publisher: ELSEVIER SCIENCE & TECHNOLOGY, August of 2006 ‧
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A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.

Vlsi Test Principles And Architectures

Design For Testability

by Laung-Terng Wang, Xiaoqing Wen e Cheng-Wen Wu

Property Description
ISBN: 9780123705976
Publisher: ELSEVIER SCIENCE & TECHNOLOGY
Release Date: August of 2006
Language: English
Cover: Hardcover
Pages: 808
Format: Book
Collection: Systems On Silicon
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9780123705976