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Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System eBook

by Jun Zhang, Rui Du, Cheng Qian, Gaoxian Li, Yaoyi Yu e Xiong Du
language: english
Publisher: Springer Nature Singapore, July of 2022 ‧
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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management.

Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System

by Jun Zhang, Rui Du, Cheng Qian, Gaoxian Li, Yaoyi Yu e Xiong Du

Property Description
ISBN: 9789811931321
Publisher: Springer Nature Singapore
Release Date: July of 2022
Language: English
Format: eBook
File Format and Compatibility:
Collection: Cpss Power Electronics Series
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9789811931321
Acessibilidade: Ver características de acessibilidade indicadas pelo editor