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Scanning Electron Microscopy And X-Ray Microanalysis eBook

Third Edition

by Joseph Goldstein, Patrick Echlin, Eric Lifshin, J.R. Michael, Linda Sawyer, Dale E. Newbury, Charles E. Lyman e David C. Joy
language: english
Publisher: SPRINGER US, December of 2012 ‧
131,84€
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Ebook for ADE
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.

Scanning Electron Microscopy And X-Ray Microanalysis

Third Edition

by Joseph Goldstein, Patrick Echlin, Eric Lifshin, J.R. Michael, Linda Sawyer, Dale E. Newbury, Charles E. Lyman e David C. Joy

Property Description
ISBN: 9781461502159
Publisher: SPRINGER US
Release Date: December of 2012
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Chemistry And Materials Science
Categories: eBooks in English > Engineering > General Engineering
eBooks in English > Dictionaries and Encyclopedias > Encyclopedias
EAN: 9781461502159

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