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Handbook Of Sample Preparation For Scanning Electron Microscopy And X-Ray Microanalysis

by Patrick Echlin
language: english
Publisher: SPRINGER-VERLAG NEW YORK INC., March of 2009 ‧
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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Handbook Of Sample Preparation For Scanning Electron Microscopy And X-Ray Microanalysis

by Patrick Echlin

Property Description
ISBN: 9780387857305
Publisher: SPRINGER-VERLAG NEW YORK INC.
Release Date: March of 2009
Language: English
Cover: Hardcover
Pages: 332
Format: Book
Categories: Books in English > Social Sciences and Humanities > History and Scientific Methodology
EAN: 9780387857305