Scanning Electron Microscopy And X-Ray Microanalysis
Third Edition
language: english
Publisher:
Springer Science+Business Media, January of 2003 ‧
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SYNOPSIS
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780306472923 |
| Publisher: | Springer Science+Business Media |
| Release Date: | January of 2003 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 689 |
| Format: | Book |
| Categories: |
Books in English
>
Social Sciences and Humanities
>
History and Scientific Methodology
Books in English > Others |
| EAN: | 9780306472923 |