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Handbook Of Sample Preparation For Scanning Electron Microscopy And X-Ray Microanalysis eBook

by Patrick Echlin
language: english
Publisher: SPRINGER US, April of 2011 ‧
174,24€
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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Handbook Of Sample Preparation For Scanning Electron Microscopy And X-Ray Microanalysis

by Patrick Echlin

Property Description
ISBN: 9780387857312
Publisher: SPRINGER US
Release Date: April of 2011
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Social Sciences and Humanities > History and Scientific Methodology
EAN: 9780387857312