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Designer'S Guide To Built-In Self-Test eBook
language: english
Publisher:
SPRINGER US, December of 2005 ‧
see product details
190,27€
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Ebook for ADE
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SYNOPSIS
Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as well as high diagnostic resolution.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780306475047 |
| Publisher: | SPRINGER US |
| Release Date: | December of 2005 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780306475047 |
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