Capa do artigo Design For Testability, Debug And Reliability
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Design For Testability, Debug And Reliability eBook

Next Generation Measures Using Formal Techniques

by Sebastian Huhn e Rolf Drechsler
language: english
Publisher: Springer International Publishing, April of 2021 ‧
131,84€
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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Design For Testability, Debug And Reliability

Next Generation Measures Using Formal Techniques

by Sebastian Huhn e Rolf Drechsler

Property Description
ISBN: 9783030692094
Publisher: Springer International Publishing
Release Date: April of 2021
Language: English
Format: eBook
File Format and Compatibility:
Collection: Engineering
Categories: eBooks in English > Engineering > Electricity and Energy
eBooks in English > Others
EAN: 9783030692094
Acessibilidade: Ver características de acessibilidade indicadas pelo editor

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