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Design For Testability, Debug And Reliability

Next Generation Measures Using Formal Techniques

by Sebastian Huhn e Rolf Drechsler
language: english
Publisher: Springer Nature Switzerland AG, April of 2021 ‧
135,18€
94,63€
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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Design For Testability, Debug And Reliability

Next Generation Measures Using Formal Techniques

by Sebastian Huhn e Rolf Drechsler

Property Description
ISBN: 9783030692087
Publisher: Springer Nature Switzerland AG
Release Date: April of 2021
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 164
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9783030692087