adicionar à lista de desejos
Helium Ion Microscopy eBook
Principles And Applications
idioma: inglês
Editor:
SPRINGER NEW YORK, setembro de 2013 ‧
ver detalhes do produto
59,61€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461486602 |
| Editor: | SPRINGER NEW YORK |
| Data de Lançamento: | setembro de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Springerbriefs In Materials |
| Classificação Temática: |
eBooks em Inglês
>
Ciências Exatas e Naturais
>
Química
|
| EAN: | 9781461486602 |
LIVROS DA MESMA COLEÇÃO
-
Pré-lançamento10%Structure Of Inversion Boundaries In Doped ZnoSpringer Nature Switzerland AG54,74€
60,82€portes grátis -
eBook10%Reduced Graphene Oxide For Supercapacitor ApplicationsSpringer Nature Singapore53,65€
59,61€
-
10%Scanning Electron Microscopy And X-Ray MicroanalysisSpringer Science+Business Media135,18€ 10% CARTÃOportes grátis
-
10%Scanning Electron Microscopy And X-Ray MicroanalysisSPRINGER-VERLAG NEW YORK INC.135,18€ 10% CARTÃOportes grátis