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Electromigration Modeling At Circuit Layout Level eBook
idioma: inglês
Editor:
Springer Nature Singapore, março de 2013 ‧
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59,61€
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9789814451215 |
| Editor: | Springer Nature Singapore |
| Data de Lançamento: | março de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Springerbriefs In Applied Sciences And Technology |
| Classificação Temática: |
eBooks em Inglês
>
Ciências Exatas e Naturais
>
Física
eBooks em Inglês > Engenharia > Eletricidade e Energia |
| EAN: | 9789814451215 |
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