Cher Ming Tan
partilhar
bibliografia
formato
Livro
EBook
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Data Edição
Ranking
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Electromigration Modeling At Circuit Layout LevelSPRINGER VERLAG, SINGAPORE05-20130,00€
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Applications Of Finite Element Methods For Reliability Studies On Ulsi InterconnectionsSPRINGER LONDON LTD03-20110,00€
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Simulated AnnealingIn Tech09-20080,00€