adicionar à lista de desejos
Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits eBook
idioma: inglês
Editor:
SPRINGER US, junho de 2007 ‧
ver detalhes do produto
237,84€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Presents the work on defect-oriented testing. This book is useful for test and design practitioners from academia and industry.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780387465470 |
| Editor: | SPRINGER US |
| Data de Lançamento: | junho de 2007 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
>
Engenharia
>
Eletricidade e Energia
|
| EAN: | 9780387465470 |
LIVROS DA MESMA COLEÇÃO
-
Timing Performance Of Nanometer Digital Circuits Under Process Variations10%Springer Nature Switzerland AG148,70€ 10% CARTÃOportes grátis
-
Timing Performance Of Nanometer Digital Circuits Under Process VariationseBook10%Springer International Publishing145,09€ 10% CARTÃO
-
Low-Power High-Resolution Analog To Digital Converters10%SPRINGER60,82€ 10% CARTÃOportes grátis