Jose Pineda De Gyvez
partilhar
bibliografia
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eBook10%Integrated Circuit Defect-Sensitivity: Theory And Computational ModelsSPRINGER US11-2013118,59€ 10% CARTÃO
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eBook10%Low-Power High-Resolution Analog To Digital ConvertersSPRINGER NETHERLANDS10-201059,61€ 10% CARTÃO
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eBook10%Defect-Oriented Testing For Nano-Metric Cmos Vlsi CircuitsSPRINGER US06-2007237,84€ 10% CARTÃO