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Models In Hardware Testing eBook
Lecture Notes Of The Forum In Honor Of Christian Landrault
idioma: inglês
Editor:
SPRINGER NETHERLANDS, novembro de 2009 ‧
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118,59€
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YlZGUU1taGpSakZHTms1MlV6SmhZVVZVS3l0elZWSm9ZWFZoUWpkRmRVMU5hbU51V21wb1FreHJWMWhIVHpoSE5EZHZkbU5RWTIxTWEwTmxPRXBITm1abkwyTnBhSEkxVEM5VmNWRklWM2hwYmxOdFVFZFBkRGhGU1RNNEwzQnlabXRNY1VsaWFGQmtPRVJvWTJ4RFpFcE9WV2xzVlVaU1VGZGlSMmd2YzA1Tk9GTk5ja3RsZG1kVVRVNXZkekZJTHpOclUyeGxMMVZUT0hFd01XeE1MMmxKVlRsaWFWTkdXamh1ZG5ObGExVlNRblpGYVV4cFRXMXNSeTgwTjI1V1FXeG5jWGxOV0ZJelVGVmxSR3R6YkZOalRWWjFORFY2WkZodFltcEdXRlZ2VEZaS1VISmpMM1pSTmxZd1lrdzNlVVpHUVU5c1Vtc3dSV05RVmtkQ1FpdEdNbWRsSzBKVGRHRjNPRmhsYUhGRUx6VlFNV2hPWTJrNWVVSlNWbHBtZWpWMk1XVnRjVWhSTm1GMVYwcFljVUZPY21SU2EyMHJRakZZZVM5NVluUkVRWGxWWjJGblozQTFhVFppV0VJMU16QlBkekZMVTAxaWRrRkVXR2t6VTJSbVlsaDBZakZ2UlhCQlowTTFia1ZTWm0xcUwweGxUVXgwWjBZNWVtaGxVM1ZTYUZwWk5pOVdUeTl2YlZBd2MzbHBTRVpUT1VneE1rZDBZa1F2YzI5M2FIWlpPUzlFV0hrM01UZFhkamcyTVRSWlJHRmtSRWRHVVc1bGFIQlRUVGx2UWpCTFNtTmtUa3hUVWxSUVVqSnRkbVpLVVhKQldVRXlWQzlQTkdoRk0wZ3pXakl2WW5kb1VHUjJXR1pzUjFaRFR6QmxhMFZwU2l0NVYxa3JNVlZ4VTBrelRteHdaM2R1TURkNWVqVkVPQzlWWlcxRmVIWjZiVTVZVEVZek5sWnBRVGx4ZEc5SGVXUTNZbXc1YkU1T1F6bE9UV295ZEdkNVUyeFpkRFZVTnlzeVkxTjJWekZyVTFnNWRTOXpiWEJ2YnpCcE5sbERjWFpMVjA0eFluUkRlSFJIVm5GVk4zQnBlakJYYW5Wa1dWYzNURlJLVFV4eFJHdEhjM1UzZGtJeVlXWjVSa0p5VWpSUGRuTm1XV2xUVURJd1ZsSlRTa05zY25od1VGTTJjM04zYlU1SWRVbFBjMkZNY0hKV2VDdFBUWGhvU1RWdE9XeFlkMFpxVWxWM1NqRnRRakJsVnpVck4yazNTalpZYzBsU1VubzBka1JLUTJGcVZtOXlVVGRUT1NzMWJIWk9ZMHhKUFE9PTpmWFcyTExxRXM1d0JDS29paEl2YlNnPT0=
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Model based testing is the most powerful technique for testing hardware and software systems. This book describes the use of models at all the levels of hardware testing. It includes a description of fault models for nanoscaled CMOS technology.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9789048132829 |
| Editor: | SPRINGER NETHERLANDS |
| Data de Lançamento: | novembro de 2009 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
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| EAN: | 9789048132829 |
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