Manoj Sachdev
partilhar
bibliografia
ordenação
Data Edição
Ranking
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Defect Oriented Testing For Cmos Analog And Digital CircuitseBookSPRINGER US06-20130,00€
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Cmos Sram Circuit Design And Parametric Test In Nano-Scaled TechnologieseBookSPRINGER NETHERLANDS06-20080,00€
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Esd Protection Device And Circuit Design For Advanced Cmos TechnologieseBookSPRINGER NETHERLANDS04-20080,00€
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Defect-Oriented Testing For Nano-Metric Cmos Vlsi CircuitseBookSPRINGER US06-20070,00€
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Thermal And Power Management Of Integrated CircuitseBookSPRINGER US06-20060,00€