adicionar à lista de desejos
Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies eBook
Process-Aware Sram Design And Test
idioma: inglês
Editor:
SPRINGER NETHERLANDS, junho de 2008 ‧
ver detalhes do produto
184,84€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Covers a broad range of topics related to SRAM design and test. This book places emphasis on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781402083631 |
| Editor: | SPRINGER NETHERLANDS |
| Data de Lançamento: | junho de 2008 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
>
Engenharia
>
Eletricidade e Energia
|
| EAN: | 9781402083631 |
LIVROS DA MESMA COLEÇÃO
-
10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer Nature Switzerland AG148,70€ 10% CARTÃOportes grátis
-
eBook10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer International Publishing145,09€ 10% CARTÃO
-
10%Ivan The TerribleTAYLOR & FRANCIS LTD86,51€ 10% CARTÃOportes grátis
-
10%Ivan The TerribleTAYLOR & FRANCIS LTD232,51€ 10% CARTÃOportes grátis