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Metal Impurities In Silicon- And Germanium-Based Technologies
Origin, Characterization, Control, And Device Impact
idioma: inglês
Editor:
Springer International Publishing AG, agosto de 2018 ‧
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SINOPSE
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783319939247 |
| Editor: | Springer International Publishing AG |
| Data de Lançamento: | agosto de 2018 |
| Idioma: | Inglês |
| Dimensões: | 155 x 235 x 20 mm |
| Encadernação: | Capa dura |
| Páginas: | 438 |
| Tipo de produto: | Livro |
| Coleção: | Springer Series In Materials Science |
| Classificação Temática: |
Livros em Inglês
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| EAN: | 9783319939247 |
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