Influence Of Temperature On Microelectronics And System Reliability
A Physics Of Failure Approach
idioma: inglês
Editor:
TAYLOR & FRANCIS INC, abril de 1997 ‧
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SINOPSE
This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780849394508 |
| Editor: | TAYLOR & FRANCIS INC |
| Data de Lançamento: | abril de 1997 |
| Idioma: | Inglês |
| Dimensões: | 178 x 254 x 21 mm |
| Encadernação: | Capa dura |
| Páginas: | 328 |
| Tipo de produto: | Livro |
| Classificação Temática: |
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| EAN: | 9780849394508 |