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Hf-Based High-K Dielectrics
Process Development, Performance Characterization, And Reliability
Livro
eBook
idioma: inglês
Editor:
Springer International Publishing AG, dezembro de 2007 ‧
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33,79€
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SINOPSE
Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. The origin of soft breakdown (first breakdown) was studied and the results suggested that the soft breakdown may be due to one layer breakdown in the bilayer structure (HfO2/SiO2: 4 nm/4 nm).
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783031014246 |
| Editor: | Springer International Publishing AG |
| Data de Lançamento: | dezembro de 2007 |
| Idioma: | Inglês |
| Dimensões: | 191 x 235 x 20 mm |
| Encadernação: | Capa mole |
| Páginas: | 92 |
| Tipo de produto: | Livro |
| Coleção: | Synthesis Lectures On Solid State Materials And Devices |
| Classificação Temática: |
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| EAN: | 9783031014246 |
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