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Fundamentals Of Atomic Force Microscopy - Part I: Foundations
idioma: inglês
Editor:
WORLD SCIENTIFIC PUBLISHING CO PTE LTD, novembro de 2015 ‧
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SINOPSE
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9789814630344 |
| Editor: | WORLD SCIENTIFIC PUBLISHING CO PTE LTD |
| Data de Lançamento: | novembro de 2015 |
| Idioma: | Inglês |
| Dimensões: | 158 x 238 x 23 mm |
| Encadernação: | Capa dura |
| Páginas: | 342 |
| Tipo de produto: | Livro |
| Coleção: | Lessons From Nanoscience: A Lecture Notes Series |
| Classificação Temática: |
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| EAN: | 9789814630344 |
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