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Scanning Electron Microscopy And X-Ray Microanalysis

Third Edition

by Joseph Goldstein, Patrick Echlin, Eric Lifshin, J.R. Michael, Linda Sawyer, Dale E. Newbury, Charles E. Lyman e David C. Joy
language: english
Publisher: Springer Science+Business Media, January of 2003 ‧
135,18€
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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

Scanning Electron Microscopy And X-Ray Microanalysis

Third Edition

by Joseph Goldstein, Patrick Echlin, Eric Lifshin, J.R. Michael, Linda Sawyer, Dale E. Newbury, Charles E. Lyman e David C. Joy

Property Description
ISBN: 9780306472923
Publisher: Springer Science+Business Media
Release Date: January of 2003
Language: English
Cover: Hardcover
Pages: 689
Format: Book
Categories: Books in English > Social Sciences and Humanities > History and Scientific Methodology
Books in English > Others
EAN: 9780306472923