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Scanning Electron Microscopy And X-Ray Microanalysis

by Joseph I. Goldstein, David C. Joy, John Henry J. Scott, Nicholas W.M. Ritchie, Joseph R. Michael e Dale E. Newbury
language: english
Publisher: SPRINGER-VERLAG NEW YORK INC., November of 2017 ‧
135,18€
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Scanning Electron Microscopy And X-Ray Microanalysis

by Joseph I. Goldstein, David C. Joy, John Henry J. Scott, Nicholas W.M. Ritchie, Joseph R. Michael e Dale E. Newbury

Property Description
ISBN: 9781493966745
Publisher: SPRINGER-VERLAG NEW YORK INC.
Release Date: November of 2017
Language: English
Dimensions: 210 x 279 x 20 mm
Cover: Hardcover
Pages: 550
Format: Book
Categories: Books in English > Social Sciences and Humanities > History and Scientific Methodology
Books in English > Others
EAN: 9781493966745