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Optical Scattering
Measurement And Analysis
language: english
Publisher:
SPIE PRESS, September of 2025 ‧
see product details
90,04€
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SYNOPSIS
Exploring the link between surface roughness and light scatter, the text connects BRDF and fractional scatter to rapid product inspection. It explains how scatterometry detects semiconductor defects and appearance variations in everyday items, offering practical methods for swift quality control.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781510690288 |
| Publisher: | SPIE PRESS |
| Release Date: | September of 2025 |
| Language: | English |
| Cover: | Softcover |
| Pages: | 368 |
| Format: | Book |
| Collection: | Press Monographs |
| Categories: |
Books in English
>
Engineering
>
General Engineering
|
| EAN: | 9781510690288 |
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