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Optical Scattering

Measurement And Analysis

by John C. Stover
language: english
Publisher: SPIE PRESS, September of 2025 ‧
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Exploring the link between surface roughness and light scatter, the text connects BRDF and fractional scatter to rapid product inspection. It explains how scatterometry detects semiconductor defects and appearance variations in everyday items, offering practical methods for swift quality control.

Optical Scattering

Measurement And Analysis

by John C. Stover

Property Description
ISBN: 9781510690288
Publisher: SPIE PRESS
Release Date: September of 2025
Language: English
Cover: Softcover
Pages: 368
Format: Book
Collection: Press Monographs
Categories: Books in English > Engineering > General Engineering
EAN: 9781510690288