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Guidebook For Managing Silicon Chip Reliability
language: english
Publisher:
TAYLOR & FRANCIS INC, December of 1998 ‧
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141,95€
30% OFF
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SYNOPSIS
Examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This book provides a framework for how to model the mechanism, test for defects, and avoid and manage damage.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780849396243 |
| Publisher: | TAYLOR & FRANCIS INC |
| Release Date: | December of 1998 |
| Language: | English |
| Dimensions: | 156 x 235 x 18 mm |
| Cover: | Hardcover |
| Pages: | 224 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780849396243 |