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Fundamentals Of Atomic Force Microscopy - Part I: Foundations

by Ronald G (Purdue Univ, Usa) Reifenberger
language: english
Publisher: WORLD SCIENTIFIC PUBLISHING CO PTE LTD, November of 2015 ‧
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

by Ronald G (Purdue Univ, Usa) Reifenberger

Property Description
ISBN: 9789814630351
Publisher: WORLD SCIENTIFIC PUBLISHING CO PTE LTD
Release Date: November of 2015
Language: English
Dimensions: 229 x 155 x 19 mm
Cover: Softcover
Pages: 342
Format: Book
Collection: Lessons From Nanoscience: A Lecture Notes Series
Categories: Books in English > Engineering > General Engineering
Books in English > Others
EAN: 9789814630351