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Fundamentals Of Atomic Force Microscopy - Part I: Foundations
language: english
Publisher:
WORLD SCIENTIFIC PUBLISHING CO PTE LTD, November of 2015 ‧
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SYNOPSIS
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9789814630344 |
| Publisher: | WORLD SCIENTIFIC PUBLISHING CO PTE LTD |
| Release Date: | November of 2015 |
| Language: | English |
| Dimensions: | 158 x 238 x 23 mm |
| Cover: | Hardcover |
| Pages: | 342 |
| Format: | Book |
| Collection: | Lessons From Nanoscience: A Lecture Notes Series |
| Categories: |
Books in English
>
Engineering
>
General Engineering
Books in English > Others |
| EAN: | 9789814630344 |
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